Dielectric Measurements

Dielectric Resonators for Dielectric Testing

Shown above are two examples of Resonators used to characterize dielectric materials. These Resonators can be designed for liquids or machined materials to characterize. Many lower-frequency units are also available

Dielectric resonators are used in dielectric measurements because their resonant frequency shifts when placed in proximity to a material with different dielectric properties. This shift in frequency can be precisely measured and correlated to the dielectric properties of the material under test, enabling accurate characterization. This is used with a Network analyzer for very precise measurements.

The service employs precision coaxial airlines, microstrip fixtures, and waveguides connected to a Vector Network Analyzer for accurate microwave and millimeter wave measurements. Coaxial airlines (up to 27 GHz) are available for purchase upon request.

Our microwave test fixtures enable rapid, precise, and non-destructive measurements of complex permittivity and permeability in dielectrics and thin films down to 20 microns. High accuracy is achieved using calibrated precision airlines, with data validation through both VNA results and 3D electromagnetic simulations. We also offer S Parameter, crosstalk, delay, impedance, TDR line delay, and propagation velocity testing, as well as CST modeling services for customers needing computational support.

These products are often used to test products for Microwave Heating applications. The results of the service are very accurate dielectric measurements, which, enable optimized process control. It is often used in material, pharmaceutical and process applications.

The actual measurements are done in a lab in NY and a full report is issued with graphs and data. We can arrange to have NDA’s signed. A description of the material to be characterized, frequency and temperature needs to be provided.

After characterization is done, using EM simulation, the microwave oven can be optimized.

Examples of Measurement Data for Dielectric Constants

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